Electronic properties of nanoscale silver crystals at the interface of silver thick film contacts on n-type silicon

Kontermann, Stefan; Willeke, Gerhard; Bauer, Jan

Author

Kontermann, Stefan

Willeke, Gerhard

Bauer, Jan

Date

2010-11-11

Version

Published Version

Metadata

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Aufsatz

Keywords

Contact impedance
Electrical properties and parameters
Current crowding
Electric measurements
Telecommunications engineering
Atomic force microscopy
Transition metals
Chemical elements
Potential energy barrier
Doping

DDC Classification

620 Ingenieurwissenschaften

Published in

Applied Physics Letters. AIP Publishing (2010). 97, 19, 191910, 3 Seiten. DOI: 10.1063/1.3508950

Faculty

Fachbereich Ingenieurwesen

Link to publication

https://hlbrm.pur.hebis.de/xmlui/handle/123456789/405
https://doi.org/10.1063/1.3508950

Collections

Publikationsnachweise [116]

BibTeX

@article{Kontermann2010,
    author={Kontermann, Stefan and Willeke, Gerhard and Bauer, Jan},
    title={Electronic properties of nanoscale silver crystals at the interface of silver thick film contacts on n-type silicon},
    journal={Applied Physics Letters},
    volume={97},
    number={19},
    pages={3 Seiten},
    month={11},
    year={2010},
    publisher={AIP Publishing},
    school={Hochschule RheinMain, Wiesbaden},
    url={https://hlbrm.pur.hebis.de/xmlui/handle/123456789/405}
}