Electronic properties of nanoscale silver crystals at the interface of silver thick film contacts on n-type silicon
Aufsatz
Schlagworte
Contact impedance
Electrical properties and parameters
Current crowding
Electric measurements
Telecommunications engineering
Atomic force microscopy
Transition metals
Chemical elements
Potential energy barrier
Doping
Electrical properties and parameters
Current crowding
Electric measurements
Telecommunications engineering
Atomic force microscopy
Transition metals
Chemical elements
Potential energy barrier
Doping
DDC-Klassifikation
620 Ingenieurwissenschaften
Erschienen in
Applied Physics Letters. AIP Publishing (2010). 97, 19, 191910, 3 Seiten. DOI: 10.1063/1.3508950
Einrichtung
Fachbereich Ingenieurwesen
Link zur Veröffentlichung
Sammlungen
- Publikationsnachweise [116]
BibTeX
@article{Kontermann2010,
author={Kontermann, Stefan and Willeke, Gerhard and Bauer, Jan},
title={Electronic properties of nanoscale silver crystals at the interface of silver thick film contacts on n-type silicon},
journal={Applied Physics Letters},
volume={97},
number={19},
pages={3 Seiten},
month={11},
year={2010},
publisher={AIP Publishing},
school={Hochschule RheinMain, Wiesbaden},
url={https://hlbrm.pur.hebis.de/xmlui/handle/123456789/405}
}
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