dc.contributor.author | Paulus, Simon |
dc.contributor.author | Roser, Michael |
dc.contributor.author | Mc Kearney, Patrick |
dc.contributor.author | Will, Matthias |
dc.contributor.author | Schäfer, Sören |
dc.contributor.author | Kontermann, Stefan |
dc.contributor.other | Fachbereich Ingenieurwesen |
dc.contributor.other | Institut für Mikrosystemtechnik (IMtech) |
dc.date.accessioned | 2023-03-09T10:11:09Z |
dc.date.available | 2023-03-09T10:11:09Z |
dc.date.issued | 2023-01-13 |
dc.identifier.uri | https://hlbrm.pur.hebis.de/xmlui/handle/123456789/98 |
dc.identifier.uri | http://dx.doi.org/10.25716/pur-76 |
dc.format.extent | 11 Seiten |
dc.language.iso | en |
dc.publisher | IOP Publ.; Bristol |
dc.relation.ispartof | Semiconductor science and technology |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ |
dc.subject | crystallinity |
dc.subject | hyperdoping |
dc.subject | sub-bandgap |
dc.subject | femtosecond laser |
dc.subject | annealing |
dc.subject | etching |
dc.subject.ddc | 500 Naturwissenschaften::530 Physik |
dc.title | Classification of different post-hyperdoping treatments for enhanced crystallinity of IR-sensitive femtosecond-laser processed silicon |
dc.type | Aufsatz |
dcterms.accessRights | open access |
pur.source.volume | 38 |
dc.description.version | Published Version |
dc.identifier.eissn | 1361-6641 |
pur.source.articlenumber | 024002 |
pur.source.date | 2023 |
dc.identifier.doi | 10.1088/1361-6641/acad93 |
dc.identifier.url | https://doi.org/10.1088/1361-6641/acad93 |
pur.fundingProject | / DFG / 429413061 |
pur.fundingProject | / BMBF / 03INT701AA |