Extracting accurate capacitance voltage curves from impedance spectroscopy
Aufsatz
Schlagworte
Hall effect
Semiconductor structures
Doping
Schottky barriers
Semiconductor materials
Metal-oxide-semiconductor
Electrical properties and parameters
P-N junctions
Electric power
Electrochemical impedance spectroscopy
Semiconductor structures
Doping
Schottky barriers
Semiconductor materials
Metal-oxide-semiconductor
Electrical properties and parameters
P-N junctions
Electric power
Electrochemical impedance spectroscopy
DDC-Klassifikation
620 Ingenieurwissenschaften
Erschienen in
Applied Physics Letters. AIP Publishing (2012). 100, 4, 042101, 4 S.. ISSN: 0003-6951, eISSN: 1077-3118, DOI: 10.1063/1.3679380
Einrichtung
Fachbereich Ingenieurwesen
Link zur Veröffentlichung
Sammlungen
- Publikationsnachweise [126]
BibTeX
@article{Guenther2012,
author={Guenther, Kay-Michael and Witte, Hartmut and Krost, Alois and Kontermann, Stefan and Schade, Wolfgang},
title={Extracting accurate capacitance voltage curves from impedance spectroscopy},
journal={Applied Physics Letters},
volume={100},
number={4},
pages={4 S.},
month={01},
year={2012},
publisher={AIP Publishing},
school={Hochschule RheinMain, Wiesbaden},
url={https://hlbrm.pur.hebis.de/xmlui/handle/123456789/451}
}
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