Simulating the interface morphology of silver thick film contacts on n-type Si-(100) and Si-(111)

Kontermann, Stefan; Ruf, Alexander; Preu, Ralf; Willeke, Gerhard

Author

Date

2012-09-18

Version

Published Version

Metadata

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Aufsatz

Keywords

Phase transitions
Telecommunications engineering
Contact impedance
Etching
Algebraic topology
Oxides
Transition metals
Chemical elements
Redox reactions
Chemical bonding

DDC Classification

620 Ingenieurwissenschaften

Published in

Applied Physics Letters. AIP Publishing (2012). 101, 12, 121907, 4 S.. ISSN: 0003-6951, eISSN: 1077-3118, DOI: 10.1063/1.4752228

Faculty

Fachbereich Ingenieurwesen

Link to publication

https://hlbrm.pur.hebis.de/xmlui/handle/123456789/450
https://doi.org/10.1063/1.4752228

Collections

Publikationsnachweise [128]

BibTeX

@article{Kontermann2012,
    author={Kontermann, Stefan and Ruf, Alexander and Preu, Ralf and Willeke, Gerhard},
    title={Simulating the interface morphology of silver thick film contacts on n-type Si-(100) and Si-(111)},
    journal={Applied Physics Letters},
    volume={101},
    number={12},
    pages={4 S.},
    month={09},
    year={2012},
    publisher={AIP Publishing},
    school={Hochschule RheinMain, Wiesbaden},
    url={https://hlbrm.pur.hebis.de/xmlui/handle/123456789/450}
}